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VLSI-SoC: Advanced Topics on Systems on a Chip

A Selection of Extended Versions of the Best Papers of the Fourteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC2007), October 15-17, 2007, Atlanta, USA

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  • © 2009

Overview

Editors:
  1. Paul Hasler
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  2. Vincent Mooney
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  3. Ricardo Reis
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  • The papers in this volume were peer-reviewed and carefully selected
  • Much information in this series is published in advance of journal publication
  • The contributors in this volume are world-renowned experts in their field

Part of the book series: IFIP Advances in Information and Communication Technology (IFIPAICT, volume 291)

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Table of contents (16 chapters)

  1. Front Matter

    Pages 1-8
    Download chapter PDF

  2. Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS Technologies.

    • Gustavo Neuberger, Gilson Wirth, Fernanda Kastensmidt, Ricardo Reis
    Pages 1-16

  3. Use of Gray Decoding for Implementation of Symmetric Functions

    • Osnat Keren, Ilya Levin, Radomir S. Stankovic
    Pages 1-16

  4. A Programmable Multi-Dimensional Analog Radial-Basis- Function-Based Classifier

    • Sheng-Yu Peng, Paul E. Hasler, David V. Anderson
    Pages 1-20

  5. Compression-based SoC Test Infrastructures

    • Julien DALMASSO, Marie-Lise FLOTTES, Bruno ROUZEYRE
    Pages 1-15

  6. Parametric Structure-Preserving Model Order Reduction

    • Jorge Fernández Villena, Wil H.A. Schilders, L. Miguel Silveira
    Pages 1-20

  7. ReCPU: a Parallel and Pipelined Architecture for Regular Expression Matching

    • Marco Paolieri, Ivano Bonesana, Marco Domenico Santambrogio
    Pages 1-20

  8. QoS in Networks-on-Chip – Beyond Priority and Circuit Switching Techniques

    • Aline Mello, Ney Calazans, Fernando Moraes
    Pages 1-22

  9. Accurate Performance Estimation using Circuit Matrix Models in Analog Circuit Synthesis

    • Almitra Pradhan, Ranga Vemuri
    Pages 1-20

  10. Statistical and Numerical Approach for a Computer efficient circuit yield analysis

    • Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Reis
    Pages 1-24

  11. SWORD: A SAT like Prover Using Word Level Information

    • Robert Wille, Görschwin Fey, Daniel Große, Daniel Große, Stephan Eggersglüß, Rolf Drechsler
    Pages 1-17

  12. A new analytical approach of the impact of jitter on continuous time delta sigma converters.

    • J. Goulier, E. Andre, M. Renaudin
    Pages 1-16

  13. An adaptive genetic algorithm for dynamically reconfigurable modules allocation

    • Vincenzo Rana, Chiara Sandionigi, Marco Santambrogio, Donatella Sciuto
    Pages 1-18

  14. The Hazard-Free Superscalar Pipeline Fast Fourier Transform Architecture and Algorithm

    • Bassam Mohd, Earl E. Swartzlander Jr., Adnan Aziz
    Pages 1-22

  15. System and Procesor Design Effort Estimation

    • Cyrus Bazeghi, Francisco J. Mesa-Martinez, Jose Renau
    Pages 1-21

  16. Reconfigurable Acceleration with Binary Compatibility for General Purpose Processors

    • Antonio Carlos Schneider Beck, Luigi Carro
    Pages 1-16

  17. First Order, Quasi-Static, SOI Charge Conserving Power Dissipation Model

    • Sameer Sharma , L G. Johnson
    Pages 1-23

  18. Back Matter

    Pages 1-1
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Keywords

About this book

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.

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