Overview
- Describes a standardizable framework for verification
- Defines a complete, precise nonmenclature for functional verification
- Outlines clear requirements for standardizable results that can be compared across disparate projects
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Table of contents (7 chapters)
Keywords
About this book
Standardized Functional Verification describes the science of functional verification that applies to any digital hardware system. With a precise and comprehensive terminology this book describes a thorough technical framework for achieving superior results with greater efficiency. It also defines a scientific basis for achieving functional closure and shows how true functional closure can be measured by software.
The author provides a wealth of practical guidance to the practicing professional. It describes how to compare results from differing projects and how to assess the risk of functional bugs at tape-out or at any other critical product juncture. The book also shows consumers how to compare IP offerings from multiple vendors. For producers, it describes how to verify IP in a manner that meets customer needs. Producers and consumers of silicon IP therefore have a solid framework to communicate requirements and to align expectations effectively and efficiently.
Standardized Functional Verification is a valuable reference for verification engineers and managers, and also for developers of verification software. The principles and theory this book describes will drive creation of the next generation of verification tools.
Authors and Affiliations
Bibliographic Information
Book Title: Standardized Functional Verification
Authors: Alan Wiemann
DOI: https://doi.org/10.1007/978-0-387-71733-3
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2008
Hardcover ISBN: 978-0-387-71732-6Published: 14 September 2007
Softcover ISBN: 978-1-4419-4407-8Published: 04 November 2010
eBook ISBN: 978-0-387-71733-3Published: 23 October 2007
Edition Number: 1
Number of Pages: XVIII, 276
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design, Electrical Engineering, Electronics and Microelectronics, Instrumentation