Authors:
- Unified Treatment of Data Collection, Modeling, and Statistical CAD
- Covers From Fabrication to Design to CAD
- Deals With the Extraction of Fab Information into distrubutions for analysis
- Circuit Structures and Techniques to Reduce On-Chip Variability
- Using CAD for the Analysis and Optimization of Timing and Power
- Includes supplementary material: sn.pub/extras
Part of the book series: Integrated Circuits and Systems (ICIR)
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Table of contents (13 chapters)
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Front Matter
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Sources of Variability
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Variability Characterization and Analysis
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Design Techniques for Systematic Manufacturability Problems
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Back Matter
About this book
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
- understanding the causes of variability;
- design of test structures for variability characterization;
- statistically rigorous data analysis;
- techniques of design for manufacturability in lithography and in chemical mechanical polishing;
- statistical simulation, analysis, and optimization techniques for improving parametric yield.
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
Authors and Affiliations
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The University of Texas at Austin, Austin, USA
Michael Orshansky
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IBM Research Laboratories, Austin, USA
Sani R. Nassif
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Massachusetts Institute of Technology, Cambridge, USA
Duane Boning
Bibliographic Information
Book Title: Design for Manufacturability and Statistical Design
Book Subtitle: A Constructive Approach
Authors: Michael Orshansky, Sani R. Nassif, Duane Boning
Series Title: Integrated Circuits and Systems
DOI: https://doi.org/10.1007/978-0-387-69011-7
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2008
Hardcover ISBN: 978-0-387-30928-6Published: 03 December 2007
Softcover ISBN: 978-1-4419-4044-5Published: 24 November 2010
eBook ISBN: 978-0-387-69011-7Published: 28 October 2007
Series ISSN: 1558-9412
Series E-ISSN: 1558-9420
Edition Number: 1
Number of Pages: XIV, 316
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design, Industrial and Production Engineering, Electrical Engineering