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Solder Joint Technology

Materials, Properties, and Reliability

  • Book
  • © 2007

Overview

  • Addresses the urgent need for reliable, lead-free solders in electronic manufacturing
  • Reviews the basic science of copper-tin reactions and electromigration
  • Emphasizes reliability issues related to solder joint reactions and electromigration induced failure in electronic consumer products and computers
  • Discusses the need for and suggests improvements in solder joint reliability and the science of solder joint behavior

Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 92)

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Table of contents (12 chapters)

  1. Introduction

  2. Electromigration and Thermomigration

Keywords

About this book

Solder joints are ubiquitous in electronic consumer products. The European Union has a directive to ban the use of Pb-based solders in these products on July 1st, 2006. There is an urgent need for an increase in the research and development of Pb-free solders in electronic manufacturing. For example, spontaneous Sn whisker growth and electromigration induced failure in solder joints are serious issues. These reliability issues are quite complicated due to the combined effect of electrical, mechanical, chemical, and thermal forces on solder joints. To improve solder joint reliability, the science of solder joint behavior under various driving forces must be understood. In this book, the advanced materials reliability issues related to copper-tin reaction and electromigration in solder joints are emphasized and methods to prevent these reliability problems are discussed.

Authors and Affiliations

  • Department of Materials Science and Engineering, University of California at Los Angeles, Los Angeles, USA

    King-Ning Tu

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