Overview
- First book that reviews a comprehensive set of advanced electronic testing topics
- Hot" topics of current interest to test technology community has been selected
- Authors are key contributors in the corresponding topics
- The book has a practical, industrial orientation that makes it valuable both to the academic/research community and the industry/practitioning industry
Part of the book series: Frontiers in Electronic Testing (FRET, volume 27)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (11 chapters)
-
Front Matter
-
Back Matter
Keywords
About this book
Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.
The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.
Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.
"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.
Reviews
"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role."
From the Foreword by Vishwani D. Agrawal, Consulting Editor
Frontiers in Electronic Testing Book Series
Editors and Affiliations
Bibliographic Information
Book Title: Advances in Electronic Testing
Book Subtitle: Challenges and Methodologies
Editors: Dimitris Gizopoulos
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/0-387-29409-0
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2006
Hardcover ISBN: 978-0-387-29408-7Published: 23 January 2006
Softcover ISBN: 978-1-4899-8773-0Published: 05 December 2014
eBook ISBN: 978-0-387-29409-4Published: 22 January 2006
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XXV, 412
Topics: Circuits and Systems, Engineering Design, Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Electrical Engineering, Performance and Reliability