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  • Book
  • © 2006

Electromagnetic Compatibility of Integrated Circuits

Techniques for low emission and susceptibility

  • Covers IC design, noise modeling and characterization, electromagnetism, packaging and EMC measurements
  • Includes standardized measurement methods, standardized modeling approaches, and dedicated tools
  • Includes supplementary material: sn.pub/extras

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xiii
  2. Basic Concepts in EMC for ICs

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 1-17
  3. Historical Review and State-of-the art

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 19-54
  4. Fundamentals and Theory

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 55-104
  5. Measurement Methods

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 105-187
  6. EMC Modeling

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 189-309
  7. Case Studies

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 311-394
  8. Guidelines

    • Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
    Pages 395-429
  9. Back Matter

    Pages 431-473

About this book

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

Editors and Affiliations

  • INSA-LESIA, Toulouse, France

    Sonia Ben Dhia, Etienne Sicard

  • ESEO, Angers, France

    Mohamed Ramdani

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access