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Data Mining and Diagnosing IC Fails

  • Book
  • © 2005

Overview

Authors:
  1. Leendert M. Huisman

    1. IBM Systems and Technology Group, USA

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  • Makes various data mining and diagnostic techniques available in one place to professionals
  • The techniques described in this book are not available in one place, and many are not even available in any book
  • Presents a new diagnosis technique SLAT -- single location at a time
  • Includes supplementary material: sn.pub/extras

Part of the book series: Frontiers in Electronic Testing (FRET, volume 31)

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Table of contents (11 chapters)

  1. Front Matter

    Pages i-xix
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  2. Introduction

    Pages 21-28

  3. Statistics

    Pages 29-37

  4. Yield Statistics

    Pages 39-54

  5. Area Dependence of the Yield

    Pages 55-82

  6. Statistics of Embedded Object Fails

    Pages 83-100

  7. Fail Commonalities

    Pages 101-116

  8. Spatial Patterns

    Pages 117-132

  9. Test Coverage and Test Fallout

    Pages 133-144

  10. Logic Diagnosis

    Pages 145-163

  11. SLAT based Diagnosis

    Pages 165-196

  12. Data Collection Requirements

    Pages 197-203

  13. Back Matter

    Pages 205-270
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Keywords

About this book

This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta­ tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.

Authors and Affiliations

  • IBM Systems and Technology Group, USA

    Leendert M. Huisman

Bibliographic Information

  • Book Title: Data Mining and Diagnosing IC Fails

  • Authors: Leendert M. Huisman

  • Series Title: Frontiers in Electronic Testing

  • DOI: https://doi.org/10.1007/b137446

  • Publisher: Springer New York, NY

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer-Verlag US 2005

  • Hardcover ISBN: 978-0-387-24993-3Published: 21 June 2005

  • Softcover ISBN: 978-1-4419-3767-4Published: 08 December 2010

  • eBook ISBN: 978-0-387-26351-9Published: 03 October 2006

  • Series ISSN: 0929-1296

  • Edition Number: 1

  • Number of Pages: XX, 250

  • Number of Illustrations: 46 b/w illustrations

  • Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation

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