A Designer’s Guide to Built-In Self-Test

1. Front Matter

   Pages i-xviii

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2. An Overview of BIST

   Pages 1-14

3. Fault Models, Detection, and Simulation

   Pages 15-42

4. Design for Testability

   Pages 43-60

5. Test Pattern Generation

   Pages 61-80

6. Output Response Analysis

   Pages 81-100

7. Manufacturing and System-Level Use of BIST

   Pages 101-120

8. Built-In Logic Block Observer

   Pages 121-136

9. Pseudo-Exhaustive BIST

   Pages 137-148

10. Circular BIST

    Pages 149-168

11. Scan-Based BIST

    Pages 169-190

12. Non-Intrusive BIST

    Pages 191-206

13. BIST for Regular Structures

    Pages 207-220

14. BIST for FPGAs and CPLDs

    Pages 221-250

15. Applying Digital BIST to Mixed-Signal Systems

    Pages 251-266

16. Merging BIST and Concurrent Fault Detection

    Pages 267-286

17. Back Matter

    Pages 287-319

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.

• FPGA
• Field Programmable Gate Array
• Signal
• VLSI
• computer-aided design (CAD)
• development
• integrated circuit
• logic
• manufacturing
• production
• simulation
• stability
• testing

• University of North Carolina at Charlotte, Charlotte, USA

  Charles E. Stroud

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