Authors:
The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globe
The authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis
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Table of contents (15 chapters)
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Front Matter
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Back Matter
About this book
Reviews
“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be without.” (Thomas J. Wilson, Scanning, Vol. 27 (4), July/August, 2005)
“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. 9 (5), October, 2003)
Authors and Affiliations
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University of Massachusetts, Amherst, USA
Joseph I. Goldstein
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National Institute of Standards and Technology, Gaithersburg, USA
Dale E. Newbury
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Cambridge Analytical Microscopy Ltd., Cambridge, England
Patrick Echlin
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University of Tennessee, Knoxville, USA
David C. Joy
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Lehigh University, Bethlehem, USA
Charles E. Lyman
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State University at Albany, Albany, USA
Eric Lifshin
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Ticona LLC, Summit, USA
Linda Sawyer
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Sandia National Laboratories, Albuquerque, USA
Joseph R. Michael
Bibliographic Information
Book Title: Scanning Electron Microscopy and X-Ray Microanalysis
Book Subtitle: Third Edition
Authors: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, … Joseph R. Michael
DOI: https://doi.org/10.1007/978-1-4615-0215-9
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2003
Hardcover ISBN: 978-0-306-47292-3Published: 31 January 2003
Softcover ISBN: 978-1-4613-4969-3Published: 31 May 2013
eBook ISBN: 978-1-4615-0215-9Published: 06 December 2012
Edition Number: 3
Number of Pages: XIX, 689
Topics: Characterization and Evaluation of Materials, Materials Science, general, Science, Humanities and Social Sciences, multidisciplinary, Biological Microscopy, Surfaces and Interfaces, Thin Films, Nanotechnology