Springer Series in Advanced Microelectronics

Stochastic Process Variation in Deep-Submicron CMOS

Circuits and Algorithms

Authors: Zjajo, Amir

  • Unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring (probably only on the market)
  • Numerous examples and easy to follow procedure for modeling, analysis and estimation of process variation, noise and temperature for both analog/mixed-signal and digital circuits
  • Both state-of-the art software and hardware implementations and their chip realizations are given
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About this book

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.

In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.

 

About the authors

Amir Zjajo received the M.Sc. and DIC degrees from the Imperial College London, London, U.K., in 2000 and the Ph.D. degree from Eindhoven University of Technology, Eindhoven, The Netherlands in 2010, all in electrical engineering. In 2000, he joined Philips Research Laboratories as a member of the research staff in the Mixed-Signal Circuits and Systems Group. From 2006 until 2009, he was with Corporate Research of NXP Semiconductors as a senior research scientist. In 2009, he joined Delft University of Technology as a Faculty member in the Circuit and Systems Group.

Dr. Zjajo has published more than 70 papers in referenced journals and conference proceedings, and holds more than 10 US patents or patents pending. He is the author of the book Low-Voltage High-Resolution A/D Converters: Design, Test and Calibration (Springer, 2011, Chinese translation, 2012). He serves as a member of Technical Program Committee of IEEE Design, Automation and Test in Europe Conference, IEEE International Symposium on Circuits and Systems and IEEE International Mixed-Signal Circuits, Sensors and Systems Workshop. His research interests include mixed-signal circuit design, signal integrity and timing and yield optimization.

Table of contents (6 chapters)

Buy this book

eBook $99.00
price for USA (gross)
  • ISBN 978-94-007-7781-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-94-007-7780-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.00
price for USA
  • ISBN 978-94-024-0285-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Stochastic Process Variation in Deep-Submicron CMOS
Book Subtitle
Circuits and Algorithms
Authors
Series Title
Springer Series in Advanced Microelectronics
Series Volume
48
Copyright
2014
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media Dordrecht
eBook ISBN
978-94-007-7781-1
DOI
10.1007/978-94-007-7781-1
Hardcover ISBN
978-94-007-7780-4
Softcover ISBN
978-94-024-0285-8
Series ISSN
1437-0387
Edition Number
1
Number of Pages
XIX, 192
Number of Illustrations and Tables
46 b/w illustrations
Topics