Springer Series in Advanced Microelectronics

Flash Memories

Economic Principles of Performance, Cost and Reliability Optimization

Authors: Richter, Detlev

  • A complete memory product and system optimization analysis is provided in-depth for NAND flash based solid-state storage systems
  • A Performance Indicator Methodology is developed to support a requirement based application shown for the specific example of a flash memory development process
  • A higher abstraction level is introduced to guide engineering teams responsible to develop system solutions to overcome the complexity of weaknesses of flash memories
  • Describes cost and performance issues and thus the road commercial success of Memory IC Design
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About this book

The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book.

Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined.  

Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process.

The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap. 

Flash Memories offers an opportunity to enhance your understanding of product development key topics such as:

·        Reliability optimization of flash memories is all about threshold voltage margin understanding and definition;
·        Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window;
·        Technical characteristics are translated into quantitative performance indicators;
·        Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution;  ·        Cost, density, performance and durability values are combined into a common factor – performance indicator - which fulfills the application requirements

About the authors

Detlev Richter is Business Area Manager at TÜV SÜD Automotive GmbH in Garching, Germany responsible for powertrain technologies. Before he led the electronic development for power inverters at Semikron GmbH & Co. KG in Nuremberg.

Before he was Director at Qimonda Flash GmbH, where he led the Product Innovation for flash memoires based on multi-bit charge trapping and multi-level floating gate flash cells. Before he was Director at Infineon Technologies AG, where he led the Product Engineering and Test activities for flash memories, ASIC’s, SOC with embedded DRAM and speciality DRAM. His research interests include “fault analysis of memories based on defect injection and simulation”, “Innovative cell and sense concepts for non-volatile memories” and “Enhancement of MLC Flash using improved ECC techniques”.

Before he was product engineer responsible for process integration and optimization for bipolar power technologies at BOSCH in Reutlingen.

He studied Electrical Engineering at TU Sofia and TU Dresden and has the Dipl.-Ing. Degree from the Technical University of Dresden.

Reviews

From the reviews:

“Comprehensive coverage of flash memories aimed at designers of flash memory, SSDs and flash based appliances. … Colorful diagrams to illustrate concepts like how 3D NAND arrays differ from 2D NAND arrays. If you are interested in how things work behind the scenes in flash memory … this is the book for you.” (R. Prakash, Amazon.com, November, 2013)

Table of contents (8 chapters)

  • Introduction

    Richter, Detlev

    Pages 1-4

  • Fundamentals of Non-Volatile Memories

    Richter, Detlev

    Pages 5-110

  • Performance Figures of Non-Volatile Memories

    Richter, Detlev

    Pages 111-148

  • Fundamentals of Reliability for Flash Memories

    Richter, Detlev

    Pages 149-166

  • Memory Based System Development and Optimization

    Richter, Detlev

    Pages 167-201

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-94-007-6082-0
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $139.00
price for USA
  • ISBN 978-94-007-6081-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $139.00
price for USA
  • ISBN 978-94-017-7974-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Flash Memories
Book Subtitle
Economic Principles of Performance, Cost and Reliability Optimization
Authors
Series Title
Springer Series in Advanced Microelectronics
Series Volume
40
Copyright
2014
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media Dordrecht
eBook ISBN
978-94-007-6082-0
DOI
10.1007/978-94-007-6082-0
Hardcover ISBN
978-94-007-6081-3
Softcover ISBN
978-94-017-7974-6
Series ISSN
1437-0387
Edition Number
1
Number of Pages
XXIV, 268
Number of Illustrations and Tables
185 b/w illustrations
Topics