Lecture Notes in Electrical Engineering

Design, Analysis and Test of Logic Circuits Under Uncertainty

Authors: Krishnaswamy, Smita, Markov, Igor L., Hayes, John P.

  • Presents a comprehensive overview of Logic Circuits
  • Combines theory with practical examples
  • Multi-discipline approach to the "hot" topic of uncertainty
see more benefits

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-90-481-9644-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-90-481-9643-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-94-007-9798-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
About this book

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Table of contents (7 chapters)

  • Introduction

    Krishnaswamy, Smita (et al.)

    Pages 1-19

  • Probabilistic Transfer Matrices

    Krishnaswamy, Smita (et al.)

    Pages 21-36

  • Computing with Probabilistic Transfer Matrices

    Krishnaswamy, Smita (et al.)

    Pages 37-52

  • Testing Logic Circuits for Probabilistic Faults

    Krishnaswamy, Smita (et al.)

    Pages 53-61

  • Signature-Based Reliability Analysis

    Krishnaswamy, Smita (et al.)

    Pages 63-91

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-90-481-9644-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-90-481-9643-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-94-007-9798-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Design, Analysis and Test of Logic Circuits Under Uncertainty
Authors
Series Title
Lecture Notes in Electrical Engineering
Series Volume
115
Copyright
2013
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media Dordrecht
eBook ISBN
978-90-481-9644-9
DOI
10.1007/978-90-481-9644-9
Hardcover ISBN
978-90-481-9643-2
Softcover ISBN
978-94-007-9798-7
Series ISSN
1876-1100
Edition Number
1
Number of Pages
XII, 124
Topics