Frontiers in Electronic Testing

Models in Hardware Testing

Lecture Notes of the Forum in Honor of Christian Landrault

Editors: Wunderlich, Hans-Joachim (Ed.)

  • Introduction of model based hardware testing
  • Describes fault models for nanoscaled CMOS technology
  • Fault simulation, ATPG and diagnosis algorithms for complex fault models
  • Comprehensive treatment including memory and low power aspects
see more benefits

Buy this book

eBook $119.00
price for USA (gross)
  • ISBN 978-90-481-3282-9
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $159.00
price for USA
  • ISBN 978-90-481-3281-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.00
price for USA
  • ISBN 978-94-007-3093-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.

Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading.

The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009.

Table of contents (8 chapters)

  • Open Defects in Nanometer Technologies

    Figueras, Joan (et al.)

    Pages 1-31

  • Models for Bridging Defects

    Renovell, Michel (et al.)

    Pages 33-70

  • Models for Delay Faults

    Reddy, Sudhakar M.

    Pages 71-103

  • Fault Modeling for Simulation and ATPG

    Becker, Bernd (et al.)

    Pages 105-131

  • Generalized Fault Modeling for Logic Diagnosis

    Wunderlich, Hans-Joachim (et al.)

    Pages 133-155

Buy this book

eBook $119.00
price for USA (gross)
  • ISBN 978-90-481-3282-9
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $159.00
price for USA
  • ISBN 978-90-481-3281-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.00
price for USA
  • ISBN 978-94-007-3093-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Models in Hardware Testing
Book Subtitle
Lecture Notes of the Forum in Honor of Christian Landrault
Editors
  • Hans-Joachim Wunderlich
Series Title
Frontiers in Electronic Testing
Series Volume
43
Copyright
2010
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media B.V.
eBook ISBN
978-90-481-3282-9
DOI
10.1007/978-90-481-3282-9
Hardcover ISBN
978-90-481-3281-2
Softcover ISBN
978-94-007-3093-9
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XIV, 257
Topics