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Scanning Force Microscopy of Polymers

  • Book
  • © 2010

Overview

Authors:
  1. Holger Schönherr

    1. FB Chemie, Biologie, Physikalische Chemie, Universität Siegen, Siegen, Germany

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  2. G. Julius Vancso

    1. MESA Inst. Nanotechnology, Lab. Supramolecular Chemistry and, University of Twente, Enschede, Netherlands

    View author publications

    You can also search for this author in PubMed   Google Scholar

  • A practice oriented book. It "teaches" the reader to pick up knowledge and skills necessary to obtain good and reliable results within the shortest possible time
  • Didactically clear and easily understandable and contains many graphical representations and visuals
  • Helps the reader to develop a conscious and critical understanding
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Laboratory (SPLABORATORY)

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Table of contents (4 chapters)

  1. Front Matter

    Pages i-xiv
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  2. Principles: Theory and Practice

    1. Front Matter

      Pages 1-1
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    2. Physical Principles of Scanning Probe Microscopy Imaging

      • Holger Schönherr, G. Julius Vancso
      Pages 3-24

    3. Atomic Force Microscopy in Practice

      • Holger Schönherr, G. Julius Vancso
      Pages 25-75

  3. Case Studies: Macromolecules, Polymer Morphology and Polymer Surface Properties by AFM

    1. Front Matter

      Pages 78-78
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    2. Visualization of Macromolecules and Polymer Morphology

      • Holger Schönherr, G. Julius Vancso
      Pages 79-187

    3. Polymer Surface and Interface Properties and (Dynamic) Processes

      • Holger Schönherr, G. Julius Vancso
      Pages 189-236

  4. Back Matter

    Pages 237-248
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Keywords

About this book

Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe are drastically reduced, thus sample damage is prevented. In addition, the use of water as imaging medium opened up new applications aiming at imaging, characterizing, and analyzing biologically important systems.

Reviews

From the reviews:

“Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. … one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. … would be suitable for both industrial researchers and academic personnel working in the laboratory. … Anyone who uses an AFM will find this book extremely useful.” (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)

Authors and Affiliations

  • FB Chemie, Biologie, Physikalische Chemie, Universität Siegen, Siegen, Germany

    Holger Schönherr

  • MESA Inst. Nanotechnology, Lab. Supramolecular Chemistry and, University of Twente, Enschede, Netherlands

    G. Julius Vancso

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