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NanoScience and Technology

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Authors: Voigtlaender, Bert

  • Presents the state-of-the-art in scanning probe techniques
  • Combines basic physical principles and their application to scanning tunneling and atomic force microscopes
  • Useful study text for graduate students and also useful  reference to researchers
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Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-662-45240-0
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-662-45239-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • Customers within the U.S. and Canada please contact Customer Service at 1-800-777-4643, Latin America please contact us at +1-212-460-1500 (Weekdays 8:30am – 5:30pm ET) to place your order.
  • Due: November 17, 2016
  • ISBN 978-3-662-50557-1
  • Free shipping for individuals worldwide
About this book

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

About the authors

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Reviews

“The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM.” (Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016)

“The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background.” (Quote translated from German, Jascha Repp, Physik Journal, issue 4, 2016)  

    

Table of contents (24 chapters)

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-662-45240-0
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-662-45239-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • Customers within the U.S. and Canada please contact Customer Service at 1-800-777-4643, Latin America please contact us at +1-212-460-1500 (Weekdays 8:30am – 5:30pm ET) to place your order.
  • Due: November 17, 2016
  • ISBN 978-3-662-50557-1
  • Free shipping for individuals worldwide
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Probe Microscopy
Book Subtitle
Atomic Force Microscopy and Scanning Tunneling Microscopy
Authors
Series Title
NanoScience and Technology
Copyright
2015
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-662-45240-0
DOI
10.1007/978-3-662-45240-0
Hardcover ISBN
978-3-662-45239-4
Softcover ISBN
978-3-662-50557-1
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XV, 382
Number of Illustrations and Tables
41 b/w illustrations, 148 illustrations in colour
Topics