Transmission Electron Microscopy and Diffractometry of Materials

Authors: Fultz, Brent, Howe, James M.

  • Designed to meet the needs of materials scientists, including students, teachers and researchers
  • It can be used as both an introductory and advanced level graduate text
  • Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
  • Problems for the student are appended to each chapter
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eBook $69.99
price for USA (gross)
  • ISBN 978-3-662-04516-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
About this Textbook

This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.

Table of contents (11 chapters)

  • Diffraction and the X-Ray Powder Diffractometer

    Fultz, Brent (et al.)

    Pages 1-61

  • The TEM and its Optics

    Fultz, Brent (et al.)

    Pages 63-121

  • Scattering

    Fultz, Brent (et al.)

    Pages 123-166

  • Inelastic Electron Scattering and Spectroscopy

    Fultz, Brent (et al.)

    Pages 167-224

  • Diffraction from Crystals

    Fultz, Brent (et al.)

    Pages 225-274

Buy this book

eBook $69.99
price for USA (gross)
  • ISBN 978-3-662-04516-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
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Bibliographic Information

Bibliographic Information
Book Title
Transmission Electron Microscopy and Diffractometry of Materials
Authors
Copyright
2001
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-662-04516-9
DOI
10.1007/978-3-662-04516-9
Edition Number
1
Number of Pages
XIX, 748
Topics