Springer Series in Surface Sciences

Surface Analysis Methods in Materials Science

Editors: O'Connor, John, Sexton, Brett, Smart, Roger (Eds.)

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  • ISBN 978-3-662-02767-7
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About this Textbook

The idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica­ tions to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur­ face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter­ ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University.

Table of contents (22 chapters)

  • Solid Surfaces, Their Structure and Composition

    Klauber, C. (et al.)

    Pages 3-65

  • UHV Basics

    Klauber, C.

    Pages 67-76

  • Electron Microscope Techniques for Surface Characterization

    Turner, P. S.

    Pages 79-96

  • Sputter Depth Profiling

    King, B. V.

    Pages 97-116

  • SIMS — Secondary Ion Mass Spectrometry

    MacDonald, R. J. (et al.)

    Pages 117-147

Buy this book

eBook $69.99
price for USA (gross)
  • ISBN 978-3-662-02767-7
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
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Bibliographic Information

Bibliographic Information
Book Title
Surface Analysis Methods in Materials Science
Editors
  • John O'Connor
  • Brett Sexton
  • Roger Smart
Series Title
Springer Series in Surface Sciences
Series Volume
23
Copyright
1992
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-662-02767-7
DOI
10.1007/978-3-662-02767-7
Series ISSN
0931-5195
Edition Number
1
Number of Pages
XXI, 453
Topics