Springer Series in Chemical Physics

Secondary Ion Mass Spectrometry SIMS II

Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979

Editors: Benninghoven, A., Evans, C.A.J., Powell, R.A., Shimizu, R., Storms, H.A. (Eds.)

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Table of contents (87 chapters)

  • The Dynamics of Ion-Solid Interactions: A Basis for Understanding SIMS

    Winograd, Nicholas

    Pages 2-6

  • Simultaneous Measurements of Photon and Secondary Ion Emissions from Ion-Bombarded Metal Surfaces

    Okutani, T. (et al.)

    Pages 7-11

  • Atom Ejection Mechanisms and Models

    Harrison, Don E. (et al.)

    Pages 12-14

  • New Models of Sputtering and Ion Knock-On Mixing

    Schwarz, S. A. (et al.)

    Pages 15-17

  • Clustering Distances in Secondary Ion Mass Spectrometry

    Honda, F. (et al.)

    Pages 18-20

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-3-642-61871-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $149.00
price for USA
  • ISBN 978-3-642-61873-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Secondary Ion Mass Spectrometry SIMS II
Book Subtitle
Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
Editors
  • A. Benninghoven
  • C.A. Jr. Evans
  • R.A. Powell
  • R. Shimizu
  • H.A. Storms
Series Title
Springer Series in Chemical Physics
Series Volume
9
Copyright
1979
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag New York
eBook ISBN
978-3-642-61871-0
DOI
10.1007/978-3-642-61871-0
Softcover ISBN
978-3-642-61873-4
Series ISSN
0172-6218
Edition Number
1
Number of Pages
XIV, 300
Topics