Springer Series in Materials Science

In-situ Materials Characterization

Across Spatial and Temporal Scales

Editors: Ziegler, A., Graafsma, H., Zhang, X.F., Frenken, J.W.M. (Eds.)

  • - scientific status report on analytical techniques in nano-and surface sciences - presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy - presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering

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About this book

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Table of contents (7 chapters)

  • In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy

    Chergui, Majed

    Pages 1-38

  • In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources

    Vonk, Vedran (et al.)

    Pages 39-58

  • In-situ Transmission Electron Microscopy

    Zhang, Xiao Feng

    Pages 59-109

  • Ultrafast Transmission Electron Microscopy and Electron Diffraction

    Ziegler, Alexander

    Pages 111-145

  • In-situ and Kinetic Studies Using Neutrons

    Eckold, Götz (et al.)

    Pages 147-179

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-642-45152-2
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-642-45151-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • ISBN 978-3-662-51976-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
In-situ Materials Characterization
Book Subtitle
Across Spatial and Temporal Scales
Editors
  • Alexander Ziegler
  • Heinz Graafsma
  • Xiao Feng Zhang
  • Joost W.M. Frenken
Series Title
Springer Series in Materials Science
Series Volume
193
Copyright
2014
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-45152-2
DOI
10.1007/978-3-642-45152-2
Hardcover ISBN
978-3-642-45151-5
Softcover ISBN
978-3-662-51976-9
Series ISSN
0933-033X
Edition Number
1
Number of Pages
XI, 256
Number of Illustrations and Tables
46 b/w illustrations, 78 illustrations in colour
Topics