Graduate Texts in Physics

Transmission Electron Microscopy and Diffractometry of Materials

Authors: Fultz, Brent, Howe, James M.

  • New edition of successful, well-reviewed textbook
  • Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry
  • Shows how wave radiation probes the structure of materials
  • Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications
  • Explains the mathematics needed consistently through the book
  • Helps to extend knowledge by indicating further reading
  • Explains concepts in detail, with no requirement for different reference materials
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eBook $99.00
price for USA (gross)
  • ISBN 978-3-642-29761-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-3-642-29760-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.00
price for USA
  • ISBN 978-3-642-43315-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
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  • online reader with highlighting and note-making option
  • can be used across all devices
About this Textbook

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

About the authors

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Reviews

``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.''
John Hutchison in Journal of Microscopy

``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron

``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University

``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’
Colin Humphreys, Cambridge University

``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’
Ronald Gronsky, University of California, Berkeley

Table of contents (13 chapters)

  • Diffraction and the X-Ray Powder Diffractometer

    Fultz, Brent (et al.)

    Pages 1-57

  • The TEM and Its Optics

    Fultz, Brent (et al.)

    Pages 59-115

  • Neutron Scattering

    Fultz, Brent (et al.)

    Pages 117-144

  • Scattering

    Fultz, Brent (et al.)

    Pages 145-180

  • Inelastic Electron Scattering and Spectroscopy

    Fultz, Brent (et al.)

    Pages 181-236

Buy this book

eBook $99.00
price for USA (gross)
  • ISBN 978-3-642-29761-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-3-642-29760-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.00
price for USA
  • ISBN 978-3-642-43315-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Transmission Electron Microscopy and Diffractometry of Materials
Authors
Series Title
Graduate Texts in Physics
Copyright
2013
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-29761-8
DOI
10.1007/978-3-642-29761-8
Hardcover ISBN
978-3-642-29760-1
Softcover ISBN
978-3-642-43315-3
Series ISSN
1868-4513
Edition Number
4
Number of Pages
XX, 764
Topics