Advances in Atom and Single Molecule Machines

Atomic Scale Interconnection Machines

Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011

Editors: Joachim, Christian (Ed.)

  • Addresses for the first time multi-probes (multi-channels) atomically precise interconnections to an atom circuit or to a single molecule circuit

Buy this book

eBook $199.00
price for USA (gross)
  • ISBN 978-3-642-28172-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $259.00
price for USA
  • ISBN 978-3-642-28171-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
About this book

This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

About the authors

Dr Christian Joachim is First Class Director of Research at the Centre National de la Recherche Scientifique (CNRS), Nanoscience group (GNS) at CEMES/CNRS Toulouse (www.cemes.fr/GNS/) and Adjunct Professor of “Nanosciences and Quantum resources” at ISAE. He coordinated the EU-sponsored projects: BUN ("Bottom-up Nanomachines") and “Pico-Inside” (www.picoinside.org) and directed 2 NATO Advanced Research Workshops on Nanoscale Sciences in the early 1990’s. He is currently in charge of the French Midi-Pyrenees research effort in Nanoscience (CPER Campus G. Dupouy)" and of the new European Integrated Project “AtMol” (www.atmol.eu). He is also A*STAR VIP attached to IMRE to develop atomic scale technology in Singapore and WPI in charge of the Toulouse MANA satellite (MEXT Japan).

Table of contents (17 chapters)

  • High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects

    Guenther, B. (et al.)

    Pages 1-8

  • Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm

    Cherepanov, Vasily (et al.)

    Pages 9-21

  • Atomic Scale Interconnection Machine

    Neucheva, O. A. (et al.)

    Pages 23-33

  • The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate

    Martrou, D. (et al.)

    Pages 35-52

  • Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System

    Wang, Zhouhang

    Pages 53-79

Buy this book

eBook $199.00
price for USA (gross)
  • ISBN 978-3-642-28172-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $259.00
price for USA
  • ISBN 978-3-642-28171-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Atomic Scale Interconnection Machines
Book Subtitle
Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011
Editors
  • Christian Joachim
Series Title
Advances in Atom and Single Molecule Machines
Copyright
2012
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-28172-3
DOI
10.1007/978-3-642-28172-3
Hardcover ISBN
978-3-642-28171-6
Series ISSN
2193-9691
Edition Number
1
Number of Pages
IX, 244
Topics