Springer Series in Surface Sciences

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

A User-Oriented Guide

Authors: Hofmann, Siegfried

  • This is the most comprehensive book available on this widely used analytical technique

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eBook $189.00
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  • ISBN 978-3-642-27381-0
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Hardcover $239.00
price for USA
  • ISBN 978-3-642-27380-3
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  • Usually dispatched within 3 to 5 business days.
Softcover $239.00
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  • ISBN 978-3-642-43173-9
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About this book

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.  

Table of contents (10 chapters)

  • Introduction and Outline

    Hofmann, Siegfried

    Pages 1-10

  • Instrumentation

    Hofmann, Siegfried

    Pages 11-41

  • Qualitative Analysis (Principle and Spectral Interpretation)

    Hofmann, Siegfried

    Pages 43-76

  • Quantitative Analysis (Data Evaluation)

    Hofmann, Siegfried

    Pages 77-204

  • Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness

    Hofmann, Siegfried

    Pages 205-257

Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-3-642-27381-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $239.00
price for USA
  • ISBN 978-3-642-27380-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $239.00
price for USA
  • ISBN 978-3-642-43173-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Book Subtitle
A User-Oriented Guide
Authors
Series Title
Springer Series in Surface Sciences
Series Volume
49
Copyright
2013
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-27381-0
DOI
10.1007/978-3-642-27381-0
Hardcover ISBN
978-3-642-27380-3
Softcover ISBN
978-3-642-43173-9
Series ISSN
0931-5195
Edition Number
1
Number of Pages
XX, 528
Topics