NanoScience and Technology

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Editors: Bhushan, Bharat (Ed.)

  • Summarizes the currrent state of the art in scanning probe microscoopy techniques
  • Contains strong part on biological applications
  • Contributions by leading researchers and application scientists from all over the world and from various industries provide a broader perspective
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  • ISBN 978-3-642-25414-7
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Hardcover $199.00
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  • ISBN 978-3-642-25413-0
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About this book

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

About the authors

Bharat Bhushan is Ohio Eminent Scholar and The Howard D. Winbigler Professor at the College of Engineering, and Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLB2) at Ohio State University, Columbus, OH. He authored 6 scientific books, more than 90 handbook chapters, more than 700 scientific papers (h factor – 42+), and more than 60 scientific reports, edited more than 45 books, and holds 17 U.S. and foreign patents. Bharat Bhusan received numerous prestigious awards and international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award. He worked for various research labs including IBM Almaden Research Center, San Jose, CA.

Table of contents (20 chapters)

  • Laser-Assisted Scanning Probe Alloying Nanolithography (LASPAN)

    Peng, Luohan (et al.)

    Pages 3-21

  • Characterization and Optimization of Quartz Tuning Fork-Based Force Sensors for Combined STM/AFM

    Castellanos-Gomez, Andres (et al.)

    Pages 23-53

  • Exploring Mesoscale Contact Mechanics by Atomic Force Microscopy

    Buzio, Renato

    Pages 55-75

  • Atomic Force Microscopy for DNA SNP Identification

    Valbusa, Ugo (et al.)

    Pages 79-98

  • Atomic Force Microscopy of Isolated Nanostructures: Biomolecular Imaging in Hydrated Environments – Status and Future Prospects

    Santos, Sergio (et al.)

    Pages 99-135

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-3-642-25414-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-3-642-25413-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Editors
  • Bharat Bhushan
Series Title
NanoScience and Technology
Copyright
2013
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-25414-7
DOI
10.1007/978-3-642-25414-7
Hardcover ISBN
978-3-642-25413-0
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XX, 630
Topics