175 years of Springer publishing +++ Through June 30: 50% off Physics & Astronomy Books

Springer Series in Surface Sciences

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

Editors: Sadewasser, Sascha, Glatzel, Thilo (Eds.)

  • First book dedicated soley to Kelvin force microscopy
  • Explains basics, realization, modulation and data interpretation
  • Provides important application examples
  • Useful reference to researchers and graduate students alike
see more benefits

Buy this book

eBook $119.00
price for USA (gross)
  • ISBN 978-3-642-22566-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $159.00
price for USA
  • ISBN 978-3-642-22565-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.00
price for USA
  • ISBN 978-3-642-27113-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Table of contents (13 chapters)

  • Introduction

    Sadewasser, S. (et al.)

    Pages 1-3

  • Experimental Technique and Working Modes

    Sadewasser, S.

    Pages 7-24

  • Capacitive Crosstalk in AM-Mode KPFM

    Diesinger, H. (et al.)

    Pages 25-44

  • The Effect of the Measuring Tip and Image Reconstruction

    Rosenwaks, Y. (et al.)

    Pages 45-67

  • Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale

    Nony, Laurent (et al.)

    Pages 69-97

Buy this book

eBook $119.00
price for USA (gross)
  • ISBN 978-3-642-22566-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $159.00
price for USA
  • ISBN 978-3-642-22565-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.00
price for USA
  • ISBN 978-3-642-27113-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Kelvin Probe Force Microscopy
Book Subtitle
Measuring and Compensating Electrostatic Forces
Editors
  • Sascha Sadewasser
  • Thilo Glatzel
Series Title
Springer Series in Surface Sciences
Series Volume
48
Copyright
2012
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-22566-6
DOI
10.1007/978-3-642-22566-6
Hardcover ISBN
978-3-642-22565-9
Softcover ISBN
978-3-642-27113-7
Series ISSN
0931-5195
Edition Number
1
Number of Pages
XIV, 334
Topics