Fringe 2009

6th International Workshop on Advanced Optical Metrology

Editors: Osten, Wolfgang, Kujawinska, Malgorzata (Eds.)

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eBook $329.00
price for USA (gross)
  • ISBN 978-3-642-03051-2
  • Digitally watermarked, DRM-free
  • Included format: PDF
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  • Immediate eBook download after purchase
Hardcover $419.00
price for USA
  • ISBN 978-3-642-03050-5
  • book with CD
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $419.00
price for USA
  • ISBN 978-3-642-43169-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields.

Topics of particular interest are:

  • New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering)
  • Application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility)
  • 4D Optical Metrology over a Large Scale Range (from Macro to Nano)
  • Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment)
  • New Optical Sensors and Measurement Systems for Industrial Inspection.

Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.

Table of contents (134 chapters)

  • Deflectometry: 3D-Metrology from Nanometer to Meter

    Häusler, G. (et al.)

    Pages 1-6

  • 3-D Sensing for Microstructures Using Dynamic DOEs

    Dong, Shihao (et al.)

    Pages 1-6

  • Pump-probe interference microscope observation for femtosecond-laser induced phenomena

    Hayasaki, Yoshio (et al.)

    Pages 1-4

  • High resolution tilt scanning interferometry system for full sensitivity depth-resolved displacement measurements in weakly scattering materials

    Burlison, S. H. (et al.)

    Pages 1-6

  • Radial in-plane achromatic digital speckle pattern interferometer using an axis-symmetrical diffractive optical element

    Albertazzi, Armando G. (et al.)

    Pages 1-6

Buy this book

eBook $329.00
price for USA (gross)
  • ISBN 978-3-642-03051-2
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $419.00
price for USA
  • ISBN 978-3-642-03050-5
  • book with CD
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $419.00
price for USA
  • ISBN 978-3-642-43169-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Fringe 2009
Book Subtitle
6th International Workshop on Advanced Optical Metrology
Editors
  • Wolfgang Osten
  • Malgorzata Kujawinska
Copyright
2009
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-03051-2
DOI
10.1007/978-3-642-03051-2
Hardcover ISBN
978-3-642-03050-5
Softcover ISBN
978-3-642-43169-2
Edition Number
1
Number of Pages
XXIV, 792
Topics