Springer Series in Advanced Microelectronics

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Authors: Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin

  • Only book on the market dedicated to this highly sensitive infrared measurement method
  • Explains the basics and applications of this analytical technique
  • A reference work for researchers and engineers alike
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eBook $149.00
price for USA (gross)
valid through November 5, 2017
  • ISBN 978-3-642-02417-7
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $189.00
price for USA
valid through November 5, 2017
  • ISBN 978-3-642-02416-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $189.00
price for USA
valid through November 5, 2017
  • ISBN 978-3-642-26478-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.

About the authors

Otwin Breitenstein studied physics at Leipzig university and graduated there in 1980. After dealing with spatially resolved capacitance spectroscopy of point defects (Scanning-DLTS) at the Institute of Solid State Physics and Electron Microscopy in Halle until 1992, he is a scientific staff member at Max Planck Institute of Microstructure Physics, Halle. His main interest field is electronic device and materials analysis by electron microscopic and IR-based methods. Wilhelm Warta studied Physics at Würzburg and then Stuttgart University, where he graduated and received his PhD with research on charge transport properties of organic molecular crystals. 1985 he joined Fraunhofer Institute for Solar Energy Systems in Freiburg starting with work on carrier lifetime measurement techniques for semiconductor materials. His fields are the development of measurement techniques for solar cell development, characterization of solar cell material and solar cells, device and process simulation as well as high precision calibration of solar cells.

Table of contents (7 chapters)

Buy this book

eBook $149.00
price for USA (gross)
valid through November 5, 2017
  • ISBN 978-3-642-02417-7
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $189.00
price for USA
valid through November 5, 2017
  • ISBN 978-3-642-02416-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $189.00
price for USA
valid through November 5, 2017
  • ISBN 978-3-642-26478-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Lock-in Thermography
Book Subtitle
Basics and Use for Evaluating Electronic Devices and Materials
Authors
Series Title
Springer Series in Advanced Microelectronics
Series Volume
10
Copyright
2010
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-02417-7
DOI
10.1007/978-3-642-02417-7
Hardcover ISBN
978-3-642-02416-0
Softcover ISBN
978-3-642-26478-8
Series ISSN
1437-0387
Edition Number
2
Number of Pages
X, 258
Number of Illustrations and Tables
56 b/w illustrations, 33 illustrations in colour
Additional Information
Originally published under: Breitenstein, O.; Langenkamp, M. and with the title "Lock-in Thermography - Basics and Applications to Functional Diagnostics of Electronic Components"
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