Springer Laboratory

Scanning Force Microscopy of Polymers

Authors: Vancso, G. Julius, Schönherr, Holger

  • A practice oriented book that "teaches" the reader to pick up the knowledge and skills necessary to obtain good and reliable results within the shortest possible time
  • Didactically clear and easily understandable, it contains many graphical representations and visuals
  • Helps the reader to develop a conscious and critical understanding
see more benefits

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-642-01231-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-642-01230-3
  • Free shipping for individuals worldwide
  • Online orders shipping within 2-3 days.
About this book

Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe are drastically reduced, thus sample damage is prevented. In addition, the use of water as imaging medium opened up new applications aiming at imaging, characterizing, and analyzing biologically important systems.

Reviews

From the reviews:

“Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. … one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. … would be suitable for both industrial researchers and academic personnel working in the laboratory. … Anyone who uses an AFM will find this book extremely useful.” (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)

Table of contents (4 chapters)

  • Physical Principles of Scanning Probe Microscopy Imaging

    Schönherr, Holger (et al.)

    Pages 3-24

  • Atomic Force Microscopy in Practice

    Schönherr, Holger (et al.)

    Pages 25-75

  • Visualization of Macromolecules and Polymer Morphology

    Schönherr, Holger (et al.)

    Pages 79-187

  • Polymer Surface and Interface Properties and (Dynamic) Processes

    Schönherr, Holger (et al.)

    Pages 189-236

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-642-01231-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-642-01230-3
  • Free shipping for individuals worldwide
  • Online orders shipping within 2-3 days.
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Scanning Force Microscopy of Polymers
Authors
Series Title
Springer Laboratory
Copyright
2010
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-01231-0
DOI
10.1007/978-3-642-01231-0
Hardcover ISBN
978-3-642-01230-3
Series ISSN
0945-6074
Edition Number
1
Number of Pages
XIV, 248
Topics