NanoScience and Technology

Applied Scanning Probe Methods XI

Scanning Probe Microscopy Techniques

Editors: Bhushan, Bharat, Fuchs, Harald (Eds.)

  • First book summarizing the state-of-the-art of this technique
  • Real industrial applications included
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Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-3-540-85037-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $239.00
price for USA
  • ISBN 978-3-540-85036-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $239.00
price for USA
  • ISBN 978-3-642-09869-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Reviews

From the reviews:

"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Table of contents (8 chapters)

  • Oscillation Control in Dynamic SPM with Quartz Sensors

    Jersch, Johann (et al.)

    Pages 1-16

  • Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation

    Bonaccurso, Elmar (et al.)

    Pages 17-38

  • Mechanical Diode-Based Ultrasonic Atomic Force Microscopies

    Cuberes, M. Teresa

    Pages 39-71

  • Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science

    Brogly, Maurice (et al.)

    Pages 73-95

  • Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements

    Hurley, Donna C.

    Pages 97-138

Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-3-540-85037-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $239.00
price for USA
  • ISBN 978-3-540-85036-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $239.00
price for USA
  • ISBN 978-3-642-09869-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods XI
Book Subtitle
Scanning Probe Microscopy Techniques
Editors
  • Bharat Bhushan
  • Harald Fuchs
Series Title
NanoScience and Technology
Copyright
2009
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-85037-3
DOI
10.1007/978-3-540-85037-3
Hardcover ISBN
978-3-540-85036-6
Softcover ISBN
978-3-642-09869-7
Series ISSN
1434-4904
Edition Number
1
Number of Pages
LVI, 236
Number of Illustrations and Tables
91 b/w illustrations, 22 illustrations in colour
Topics