NanoScience and Technology

Applied Scanning Probe Methods IX

Characterization

Editors: Bhushan, Bharat, Fuchs, Harald, Tomitori, Masahiko (Eds.)

  • First book summarizing the state-of-the-art of this technique
  • Real industrial applications included
see more benefits

Buy this book

eBook $69.99
price for USA (gross)
  • ISBN 978-3-540-74083-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $239.00
price for USA
  • ISBN 978-3-540-74082-7
  • Free shipping for individuals worldwide
  • This title is currently reprinting. You can pre-order your copy now.
Softcover $99.00
price for USA
  • ISBN 978-3-642-09341-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.

Table of contents (14 chapters)

  • Ultrathin Fullerene-Based Films via STM and STS

    Gavioli, Luca (et al.)

    Pages 1-21

  • Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode

    Gigler, Alexander M. (et al.)

    Pages 23-54

  • Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers

    Pignataro, Bruno

    Pages 55-88

  • Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells

    Rico, Félix (et al.)

    Pages 89-109

  • Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope

    Verbelen, Claire (et al.)

    Pages 111-126

Buy this book

eBook $69.99
price for USA (gross)
  • ISBN 978-3-540-74083-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $239.00
price for USA
  • ISBN 978-3-540-74082-7
  • Free shipping for individuals worldwide
  • This title is currently reprinting. You can pre-order your copy now.
Softcover $99.00
price for USA
  • ISBN 978-3-642-09341-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods IX
Book Subtitle
Characterization
Editors
  • Bharat Bhushan
  • Harald Fuchs
  • Masahiko Tomitori
Series Title
NanoScience and Technology
Copyright
2008
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-74083-4
DOI
10.1007/978-3-540-74083-4
Hardcover ISBN
978-3-540-74082-7
Softcover ISBN
978-3-642-09341-8
Series ISSN
1434-4904
Edition Number
1
Number of Pages
LIX, 387
Topics