NanoScience and Technology

Applied Scanning Probe Methods VIII

Scanning Probe Microscopy Techniques

Editors: Bhushan, Bharat, Fuchs, Harald, Tomitori, Masahiko (Eds.)

  • First book summarizing the state-of-the-art of this technique
  • Real industrial applications included
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eBook $249.00
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  • ISBN 978-3-540-74080-3
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Hardcover $319.00
price for USA
  • ISBN 978-3-540-74079-7
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  • Usually dispatched within 3 to 5 business days.
Softcover $319.00
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  • ISBN 978-3-642-09340-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.

Table of contents (12 chapters)

  • Background-Free Apertureless Near-Field Optical Imaging

    Gucciardi, Pietro Giuseppe (et al.)

    Pages 1-29

  • Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes

    Liu, Hao-Chih (et al.)

    Pages 31-75

  • Near Field Probes: From Optical Fibers to Optical Nanoantennas

    Cefalì, Eugenio (et al.)

    Pages 77-135

  • Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging

    Marsaudon, Sophie (et al.)

    Pages 137-181

  • Scanning Probes for the Life Sciences

    Ho, Andrea M. (et al.)

    Pages 183-217

Buy this book

eBook $249.00
price for USA (gross)
  • ISBN 978-3-540-74080-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $319.00
price for USA
  • ISBN 978-3-540-74079-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $319.00
price for USA
  • ISBN 978-3-642-09340-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods VIII
Book Subtitle
Scanning Probe Microscopy Techniques
Editors
  • Bharat Bhushan
  • Harald Fuchs
  • Masahiko Tomitori
Series Title
NanoScience and Technology
Copyright
2008
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-74080-3
DOI
10.1007/978-3-540-74080-3
Hardcover ISBN
978-3-540-74079-7
Softcover ISBN
978-3-642-09340-1
Series ISSN
1434-4904
Edition Number
1
Number of Pages
LIX, 465
Topics