Name: Scanning Tunneling Microscopy and Its Application
ISBN: 978-3-540-65715-6

Overview

Authors:

Chunli Bai ⁰

Chunli Bai
1. Chinese Academy of Sciences Institute of Chemistry, Beijing, China
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This volume is one of the few application-oriented STM books

Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 32)

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Keywords

Nanobiology
Nanoscience
Nanospectroscopy
STM instrumentation
Scanning Force Microscopy
Scanning Probe Microscopy
Surface Chemistry
Surface Science
Tunneling Spectroscopy
Tunneling effect
electronic structure of surfaces
scanning probe microscopy
scanning tunneling microscopy
surface adsorption
surface structure

About this book

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Authors and Affiliations

Chinese Academy of Sciences Institute of Chemistry, Beijing, China

Chunli Bai

Bibliographic Information

Book Title: Scanning Tunneling Microscopy and Its Application
Authors: Chunli Bai
Series Title: Springer Series in Surface Sciences
Publisher: Springer Berlin, Heidelberg
Copyright Information: Springer-Verlag Berlin Heidelberg 2000
Hardcover ISBN: 978-3-540-65715-6Published: 10 August 2000
Softcover ISBN: 978-3-642-08500-0Published: 01 December 2010
Series ISSN: 0931-5195
Series E-ISSN: 2198-4743
Edition Number: 2
Number of Pages: XIV, 370
Additional Information: Jointly published with Shanghai Scientific and Technical Publishers

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Scanning Tunneling Microscopy and Its Application