NanoScience and Technology

Noncontact Atomic Force Microscopy

Editors: Morita, S., Wiesendanger, Roland, Meyer, E. (Eds.)

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eBook $239.00
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  • ISBN 978-3-642-56019-4
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About this book

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Reviews

"This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic crystals, metal oxides, and organic molecular systems including thin films, polymers, and nucleic acids . . . There are unsolved questions about the mechanisms responsible for atomic resolution but, as this well-written book displays, there has been tremendous progress in basic understanding of the technique and fascinating new applications continue to arise . . . With an increased understanding of NC-AFM, as demonstrated in this book, we are certain to see further progress in the near future."

–Materials Today


Table of contents (20 chapters)

  • Introduction

    Morita, Seizo

    Pages 1-10

  • Principle of NC-AFM

    Giessibl, Franz J.

    Pages 11-46

  • Semiconductor Surfaces

    Morita, Seizo (et al.)

    Pages 47-77

  • Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductor Surfaces

    Arai, Toyoko (et al.)

    Pages 79-92

  • Alkali Halides

    Bennewitz, Roland (et al.)

    Pages 93-107

Buy this book

eBook $239.00
price for USA (gross)
  • ISBN 978-3-642-56019-4
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $309.00
price for USA
  • ISBN 978-3-540-43117-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $309.00
price for USA
  • ISBN 978-3-642-62772-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Noncontact Atomic Force Microscopy
Editors
  • S. Morita
  • Roland Wiesendanger
  • E. Meyer
Series Title
NanoScience and Technology
Copyright
2002
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-56019-4
DOI
10.1007/978-3-642-56019-4
Hardcover ISBN
978-3-540-43117-6
Softcover ISBN
978-3-642-62772-9
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XVIII, 440
Topics