Springer Series in Surface Sciences

Surface Analysis Methods in Materials Science

Editors: O'Connor, John, Sexton, Brett, Smart, Roger S.C. (Eds.)

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  • ISBN 978-3-662-05227-3
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Hardcover $69.99
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  • ISBN 978-3-540-41330-1
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Softcover $69.99
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  • ISBN 978-3-642-07458-5
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About this book

This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. Each chapter has been written by specialists in the field who draw on their experience in current developments and applications. This book is aimed at industrial scientists and engineers in research and development seeking a description of available techniques in a concise but informative style. It is invaluable as a comprehensive text for scientists and engineers attending training courses and workshops. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.

Reviews

 

I teach graduate courses on Surface Analysis and on Surface Science (with a strong component of Surface Analysis). I was so impressed with the first edition of this book that I intended to adopt it for my class but, unfortunately, it was soon out-of-print. I encouraged John O'Connor to prepare another edition of this jewel that I could use in the future. What distinguishes this book from others is the very unusual breadth. It covers fundamentals, practical issues of analyses, and concrete applications to the analysis of metals, semiconductors, polymers, and ceramics (including minerals).

Quote from Prof. Raul Baragiola, University of Virginia

From the reviews of the second edition:

"More than 30 experts have contributed to this book providing a wealth of expertise based on theoretical as well as practical background. … the book can be recommended not only to university students but also to scientists and engineers working in industry. It will help to find the appropriate method, or better the combination of methods, which will be needed to solve problems in process control and failure analysis." (W. Oesterle, Werkstoffe und Korrosion/Materials and Corrosion, Vol. 55 (3), 2004)


Table of contents (24 chapters)

  • Solid Surfaces, Their Structure and Composition

    Klauber, C. (et al.)

    Pages 3-69

  • UHV Basics

    Klauber, C.

    Pages 71-81

  • Electron Microscope Techniques for Surface Characterization

    Turner, P. S. (et al.)

    Pages 85-105

  • Sputter Depth Profiling

    King, B. V.

    Pages 107-125

  • SIMS — Secondary Ion Mass Spectrometry

    MacDonald, R. J. (et al.)

    Pages 127-154

Buy this book

eBook $54.99
price for USA (gross)
  • ISBN 978-3-662-05227-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $69.99
price for USA
  • ISBN 978-3-540-41330-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $69.99
price for USA
  • ISBN 978-3-642-07458-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Surface Analysis Methods in Materials Science
Editors
  • John O'Connor
  • Brett Sexton
  • Roger S.C. Smart
Series Title
Springer Series in Surface Sciences
Series Volume
23
Copyright
2003
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-662-05227-3
DOI
10.1007/978-3-662-05227-3
Hardcover ISBN
978-3-540-41330-1
Softcover ISBN
978-3-642-07458-5
Series ISSN
0931-5195
Edition Number
2
Number of Pages
XXVI, 585
Topics