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Springer Proceedings in Physics

Microscopy of Semiconducting Materials

Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Editors: Cullis, A.G., Hutchison, John L. (Eds.)

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  • ISBN 978-3-540-31915-3
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Hardcover $339.00
price for USA
  • ISBN 978-3-540-31914-6
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  • Usually dispatched within 3 to 5 business days.
Softcover $339.00
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  • ISBN 978-3-642-06870-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.

Table of contents (10 chapters)

  • Characterization of defects in ZnS and GaN

    J Deneen, S Kumar, C R Perrey, C B Carter

    Pages 83-86

  • Structural characterisation of MBE grown zinc-blende Ga1−xMnxN/GaAs(001) as a function of Ga flux

    Y Han, M W Fay, P D Brown, S V Novikov, K W Edmonds, B L Gallagher, R P Campion, C T Foxon

    Pages 155-158

  • Nanoanalysis of InAs/GaAs quantum dots using low-loss EELS spectra

    A M Sánchez, M H Gass, A J Papworth, et al.

    Pages 259-262

  • Growth and surface structure of silicon nanowires observed in real time in the electron microscope

    F M Ross, J Tersoff, S Kodambaka, M C Reuter

    Pages 283-286

  • TEM characterization of magnetic Sm- and Co-nanocrystals in SiC

    J Biskupek, U Kaiser, H Lichte, et al.

    Pages 319-322

Buy this book

eBook $269.00
price for USA (gross)
  • ISBN 978-3-540-31915-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $339.00
price for USA
  • ISBN 978-3-540-31914-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $339.00
price for USA
  • ISBN 978-3-642-06870-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Microscopy of Semiconducting Materials
Book Subtitle
Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Editors
  • A.G. Cullis
  • John L. Hutchison
Series Title
Springer Proceedings in Physics
Series Volume
107
Copyright
2005
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-31915-3
DOI
10.1007/3-540-31915-8
Hardcover ISBN
978-3-540-31914-6
Softcover ISBN
978-3-642-06870-6
Series ISSN
0930-8989
Edition Number
1
Number of Pages
XVI, 540
Topics