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NanoScience and Technology

Applied Scanning Probe Methods III

Characterization

Editors: Bhushan, Bharat, Fuchs, Harald (Eds.)

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About this book

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Reviews

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007


Table of contents (1 chapters)

  • Atomic Force Microscopy in Nanomedicine

    Dessy Nikova, Tobias Lange, Hans Oberleithner, Hermann Schillers, Andreas Ebner, Peter Hinterdorfer

    Pages 1-26

Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-3-540-26910-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $249.00
price for USA
  • ISBN 978-3-540-26909-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $249.00
price for USA
  • ISBN 978-3-642-06596-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods III
Book Subtitle
Characterization
Editors
  • Bharat Bhushan
  • Harald Fuchs
Series Title
NanoScience and Technology
Copyright
2006
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-26910-6
DOI
10.1007/b138285
Hardcover ISBN
978-3-540-26909-0
Softcover ISBN
978-3-642-06596-5
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XLIV, 378
Number of Illustrations and Tables
268 b/w illustrations, 2 illustrations in colour
Topics