NanoScience and Technology

Applied Scanning Probe Methods II

Scanning Probe Microscopy Techniques

Editors: Bhushan, Bharat, Fuchs, Harald (Eds.)

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About this book

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Reviews

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)


Table of contents (6 chapters)

  • Higher Harmonics in Dynamic Atomic Force Microscopy

    Robert W. Stark, Martin Stark

    Pages 1-36

  • Atomic Force Acoustic Microscopy

    Ute Rabe

    Pages 37-90

  • Scanning Ion Conductance Microscopy

    Tilman E. Schäffer, Boris Anczykowski, Harald Fuchs

    Pages 91-119

  • Dynamic Force Microscopy and Spectroscopy

    Ferry Kienberger, Hermann Gruber, Peter Hinterdorfer

    Pages 143-164

  • Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures

    Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, et al.

    Pages 321-360

Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-3-540-27453-7
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $239.00
price for USA
  • ISBN 978-3-540-26242-8
  • Free shipping for individuals worldwide
  • This title is currently reprinting. You can pre-order your copy now.
Softcover $239.00
price for USA
  • ISBN 978-3-642-06569-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods II
Book Subtitle
Scanning Probe Microscopy Techniques
Editors
  • Bharat Bhushan
  • Harald Fuchs
Series Title
NanoScience and Technology
Copyright
2006
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-540-27453-7
DOI
10.1007/b139097
Hardcover ISBN
978-3-540-26242-8
Softcover ISBN
978-3-642-06569-9
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XLIII, 420
Topics