NanoScience and Technology

Nanoscale Characterisation of Ferroelectric Materials

Scanning Probe Microscopy Approach

Editors: Alexe, Marin, Gruverman, Alexei (Eds.)

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eBook $149.00
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  • ISBN 978-3-662-08901-9
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Hardcover $199.99
price for USA
  • ISBN 978-3-540-20662-0
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Softcover $199.99
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  • ISBN 978-3-642-05844-8
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About this book

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Reviews

From the reviews:

"The aim of this book is to present recent advances in nanoscale characterization of electrical, mechanical and optical properties of ferroelectric materials made possible due to the use of the SPM techniques. … will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. … The book succeeds in being informative, balanced and intelligent … . The references at the end of each chapter also make the book consistently informative and steadily rewarding." (Current Engineering Practice, Vol. 47 (3), 2004-2005)


Table of contents (9 chapters)

  • Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces

    Kalinin, S. V. (et al.)

    Pages 1-43

  • Challenges in the Analysis of the Local Piezoelectric Response

    Harnagea, C. (et al.)

    Pages 45-85

  • Electrical Characterization of Nanoscale Ferroelectric Structures

    Tiedke, S. (et al.)

    Pages 87-114

  • Nanoscale Optical Probes of Ferroelectric Materials

    Levy, J. (et al.)

    Pages 115-142

  • Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization

    Cho, Y.

    Pages 143-162

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-3-662-08901-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA
  • ISBN 978-3-540-20662-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $199.99
price for USA
  • ISBN 978-3-642-05844-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Nanoscale Characterisation of Ferroelectric Materials
Book Subtitle
Scanning Probe Microscopy Approach
Editors
  • Marin Alexe
  • Alexei Gruverman
Series Title
NanoScience and Technology
Copyright
2004
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-662-08901-9
DOI
10.1007/978-3-662-08901-9
Hardcover ISBN
978-3-540-20662-0
Softcover ISBN
978-3-642-05844-8
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XIII, 282
Topics