NanoScience and Technology

Applied Scanning Probe Methods I

Editors: Bhushan, Bharat, Fuchs, Harald, Hosaka, Sumio (Eds.)

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About this book

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Reviews

From the reviews:

"The editors have done an excellent job of maintaining a coherent theme throughout, while keeping the repetition of ideas to a minimum. It is therefore effective when read as a whole but will also find good use as a reference book."..…"This is an excellent book for all users of SPM interested in real technological applications".
Steven R. Schofield, School of Mathematical and Physical Sciences, University of Newcastle
Journal: "The Physicist", Vol. 41, No. 6, p. 200

"This book describes some of the many ways in which SPMs are being used in the development and characterisation of real nano technological processes and devices. The editors have done an excellent job of maintaining a coherent theme throughout … . It is therefore effective when read as a whole but will also find good use as a reference book. … This is an excellent book for all users of SPM interested in real technological applications." (Steven R Schofield, The Physicist, Vol. 41 (6), November/December, 2004)

"The focus of this book is recent, practical applications of scanning probe microscopy (SPM). Because it is written by leading experts in SPM techniques, the book is strongly recommended to those working in the emerging area of nanotechnology. … Each chapter contains the relevant references and the book ends with a comprehensive index." (Mircea Dragoman, Optics and Photonics News, April, 2006)


Table of contents (16 chapters)

  • Dynamic Force Microscopy

    Schirmeisen, André (et al.)

    Pages 3-39

  • Interfacial Force Microscopy: Selected Applications

    Houston, Jack E.

    Pages 41-73

  • Atomic Force Microscopy with Lateral Modulation

    Scherer, Volker (et al.)

    Pages 75-115

  • Sensor Technology for Scanning Probe Microscopy

    Oesterschulze, Egbert (et al.)

    Pages 117-146

  • Tip Characterization for Dimensional Nanometrology

    Villarrubia, John S.

    Pages 147-168

Buy this book

eBook $249.00
price for USA (gross)
  • ISBN 978-3-642-35792-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $319.00
price for USA
  • ISBN 978-3-540-00527-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $319.00
price for USA
  • ISBN 978-3-642-05602-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Applied Scanning Probe Methods I
Editors
  • Bharat Bhushan
  • Harald Fuchs
  • Sumio Hosaka
Series Title
NanoScience and Technology
Copyright
2004
Publisher
Springer-Verlag Berlin Heidelberg
Copyright Holder
Springer-Verlag Berlin Heidelberg
eBook ISBN
978-3-642-35792-3
DOI
10.1007/978-3-642-35792-3
Hardcover ISBN
978-3-540-00527-8
Softcover ISBN
978-3-642-05602-4
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XX, 476
Topics