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Table of contents (30 papers)
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Front Matter
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Basic knowledge
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Front Matter
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Extended knowledge
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Front Matter
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About this book
This edited book, based on material presented at the EU Spec Training School on Multiple Scattering Codes and the following MSNano Conference, is divided into two distinct parts. The first part, subtitled “basic knowledge”, provides the basics of the multiple scattering description in spectroscopies, enabling readers to understand the physics behind the various multiple scattering codes available for modelling spectroscopies. The second part, “extended knowledge”, presents “state- of-the-art” short chapters on specific subjects associated with improving of the actual description of spectroscopies within the multiple scattering formalism, such as inelastic processes, or precise examples of modelling.
Editors and Affiliations
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Institut de Physique de Rennes (IPR), Univ Rennes, CNRS, UMR 6251, Rennes, France
Didier Sébilleau
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Department Chemie, Ludwig-Maximilians-Universität München, Munich, Bavaria, Germany
Keisuke Hatada, Hubert Ebert
Bibliographic Information
Book Title: Multiple Scattering Theory for Spectroscopies
Book Subtitle: A Guide to Multiple Scattering Computer Codes -- Dedicated to C. R. Natoli on the Occasion of his 75th Birthday
Editors: Didier Sébilleau, Keisuke Hatada, Hubert Ebert
Series Title: Springer Proceedings in Physics
DOI: https://doi.org/10.1007/978-3-319-73811-6
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing AG, part of Springer Nature 2018
Hardcover ISBN: 978-3-319-73810-9Published: 06 April 2018
Softcover ISBN: 978-3-030-08860-6Published: 22 December 2018
eBook ISBN: 978-3-319-73811-6Published: 05 April 2018
Series ISSN: 0930-8989
Series E-ISSN: 1867-4941
Edition Number: 1
Number of Pages: XXVII, 401
Number of Illustrations: 37 b/w illustrations, 72 illustrations in colour
Topics: Spectroscopy and Microscopy, Numerical and Computational Physics, Simulation, Surface and Interface Science, Thin Films