Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

Editors: Carter, C. Barry, Williams, David B. (Eds.)

  • An essential companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter
  • Equips the reader with a clear and deep understanding of TEM, the essential tool for studying nanomaterials
  • Presents advanced topics with the same look, feel, and approach that students already know from Williams & Carter
  • Features chapters on diffraction, high-resolution imaging, and chemical mapping by the leading experts in the field
  • Provides the fundamentals for students to understand and interpret the results of electron tomography and electron holography, even if they will not employ these techniques themselves
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Buy this book

eBook $89.00
price for USA (gross)
valid through November 5, 2017
  • ISBN 978-3-319-26651-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $119.00
price for USA
valid through November 5, 2017
  • ISBN 978-3-319-26649-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this Textbook

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

About the authors

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.
David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.

Reviews

“Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. … The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent.” (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)


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Table of contents (17 chapters)

  • Electron Sources

    Kruit, Pieter

    Pages 1-15

  • In Situ and Operando

    Jungjohann, Katherine (et al.)

    Pages 17-80

  • Electron Diffraction and Phase Identification

    Burke, M. Grace

    Pages 81-102

  • Convergent-Beam Electron Diffraction: Symmetry & Large-Aangle Patterns

    Eades, Alwyn

    Pages 103-144

  • Electron Crystallography, Charge-Density Mapping and Nanodiffraction

    Spence, John

    Pages 145-166

Buy this book

eBook $89.00
price for USA (gross)
valid through November 5, 2017
  • ISBN 978-3-319-26651-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $119.00
price for USA
valid through November 5, 2017
  • ISBN 978-3-319-26649-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Transmission Electron Microscopy
Book Subtitle
Diffraction, Imaging, and Spectrometry
Editors
  • C. Barry Carter
  • David B. Williams
Copyright
2016
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing Switzerland
eBook ISBN
978-3-319-26651-0
DOI
10.1007/978-3-319-26651-0
Hardcover ISBN
978-3-319-26649-7
Edition Number
1
Number of Pages
XXXIII, 518
Number of Illustrations and Tables
300 b/w illustrations
Topics