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Counterfeit Integrated Circuits

Detection and Avoidance

  • Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem;
  • Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation
  • Provides step-by-step solutions for detecting different types of counterfeiting
  • Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government

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Table of contents (12 chapters)

  1. Front Matter

    Pages i-xx
  2. Introduction

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 1-14
  3. Counterfeit Integrated Circuits

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 15-36
  4. Counterfeit Defects

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 37-73
  5. Physical Tests for Counterfeit Detection

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 75-93
  6. Electrical Tests for Counterfeit Detection

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 95-107
  7. Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 109-131
  8. Advanced Detection: Physical Tests

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 133-155
  9. Advanced Detection: Electrical Tests

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 157-174
  10. Combating Die and IC Recycling

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 175-201
  11. Hardware IP Watermarking

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 203-222
  12. Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 223-241
  13. Chip ID

    • Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte
    Pages 243-263
  14. Back Matter

    Pages 265-269

About this book

This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade.  The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs).  Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat.

 

·      Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem;

·      Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation;

·      Provides step-by-step solutions for detecting different types of counterfeit ICs;

·      Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.

Reviews

“In this book, the authors present an overall description of the physical and electrical techniques that are used in the state of the art. Those techniques are proven to be useful in the practical detection and avoidance of counterfeit ICs. … usable as a handbook for engineers and experts in this field.” (Zheng Gong, computing Reviews, August, 2015)

Authors and Affiliations

  • ECE Department, University of Connecticut, Storrs, USA

    Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte

About the authors

Mark (Mohammad) Tehranipoor is currently the Charles H. Knapp Associate Professor of Electrical and Computer Engineering Department at the University of Connecticut.

His current research projects include: computer-aided design and test for CMOS VLSI designs, hardware security and trust, counterfeit IC detection and prevention, and reliable systems design at nanoscale. Prof. Tehranipoor has published over 200 journal articles and refereed conference papers and has given more than 125 invited talks and keynote addresses since 2006. In addition, he has published five books and ten book chapters. His projects are sponsored by both the industry (SRC, Texas Instruments, Freescale, Comcast, Honeywell, LSI, Mentor Graphics, Cisco, Qualcomm, MediaTeck, etc.) and Government (NSF, ARO, MDA, DOD, DOE, etc.).

He is a recipient of several best paper awards, the 2008 IEEE Computer Society (CS) Meritorious Service Award, the 2012 IEEE CS Outstanding Contribution, the 2010 IEEE CS Most Successful Technical Event for co-founding and chairing HOST Symposium, the 2009 NSF CAREER Award, the 2009 UConn ECE Research Excellence Award, and the 2012 UConn SOE Outstanding Faculty Advisor Award.

He serves on the program committee of more than a dozen leading conferences and workshops. Prof. Tehranipoor served as the guest editor for JETTA, IEEE Design and Test of Computers, and IEEE Computer Society Computing Now. He served as Program Chair of the 2007 IEEE Defect-Based Testing (DBT) workshop, Program Chair of the 2008 IEEE Defect and Data Driven Testing (D3T) workshop, Co-program Chair of the 2008 International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), General Chair for D3T-2009 and DFTS-2009, and Vice-general Chair for NATW-2011.

He co-founded a new symposium called IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) ()http://www.engr.uconn.edu/HOST/) and served as HOST-2008 and HOST-2009 General Chair and continue to serve as Chair of Steering Committee for HOST. He is also a co-founder of Trust-Hub (www.trust-hub.org). He is currently serving as the Associate Editor-in-Chief (EIC) for IEEE Design and Test of Computers, an Associate Editor for JETTA, an Associate Editor for Journal of Low Power Electronics (JOLPE), an Associate Editor for ACM Transactions for Design Automation of Electronic Systems (TODAES), an IEEE Distinguished Speaker, and an ACM Distinguished Speaker.

Prof. Tehranipoor is a Senior Member of the IEEE, Golden Core Member of IEEE Computer Society, and Member of ACM and ACM SIGDA.

Bibliographic Information

  • Book Title: Counterfeit Integrated Circuits

  • Book Subtitle: Detection and Avoidance

  • Authors: Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte

  • DOI: https://doi.org/10.1007/978-3-319-11824-6

  • Publisher: Springer Cham

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer International Publishing Switzerland 2015

  • Hardcover ISBN: 978-3-319-11823-9Published: 19 March 2015

  • Softcover ISBN: 978-3-319-36485-8Published: 06 October 2016

  • eBook ISBN: 978-3-319-11824-6Published: 12 February 2015

  • Edition Number: 1

  • Number of Pages: XX, 269

  • Number of Illustrations: 25 b/w illustrations, 109 illustrations in colour

  • Topics: Circuits and Systems, Processor Architectures, Electronic Circuits and Devices

Buy it now

Buying options

eBook USD 89.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access