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  • Conference proceedings
  • © 2014

Risk Assessment and Risk-Driven Testing

First International Workshop, RISK 2013, Held in Conjunction with ICTSS 2013, Istanbul, Turkey, November 12, 2013. Revised Selected Papers

Editors:

  1. Thomas Bauer

    1. Fraunhofer IESE, Kaiserslautern, Germany

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  2. Jürgen Großmann

    1. Fraunhofer Institut FOKUS, Berlin, Germany

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  3. Fredrik Seehusen

    1. SINTEF ICT, Oslo, Norway

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  4. Ketil Stølen

    1. SINTEF ICT, Oslo, Norway

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  5. Marc-Florian Wendland

    1. Fraunhofer Institut FOKUS, Berlin, Germany

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Part of the book series: Lecture Notes in Computer Science (LNCS, volume 8418)

Part of the book sub series: Programming and Software Engineering (LNPSE)

Conference series link(s): RISK: International Workshop on Risk Assessment and Risk-driven Testing

Conference proceedings info: RISK 2013.

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Table of contents (9 papers)

  1. Front Matter

    Pages I-IX
    PDF

  2. Risk Analysis

    1. Front Matter

      Pages 1-1
      PDF

    2. Dynamic Risk Model of Money Laundering

      • Murad Mehmet, Murat Güneştaş, Duminda Wijesekera
      Pages 3-20

    3. Assessing Privacy Risks in Android: A User-Centric Approach

      • Alexios Mylonas, Marianthi Theoharidou, Dimitris Gritzalis
      Pages 21-37

    4. Security Risk Analysis by Logic Programming

      • Philipp Zech, Michael Felderer, Ruth Breu
      Pages 38-48

  3. Risk Modeling

    1. Front Matter

      Pages 49-49
      PDF

    4. Towards Attribute-Based Access Control Policy Engineering Using Risk

      • Leanid Krautsevich, Aliaksandr Lazouski, Fabio Martinelli, Artsiom Yautsiukhin
      Pages 80-90

  4. Risk-Based Testing

    1. Front Matter

      Pages 91-91
      PDF

    2. A Systematic Method for Risk-Driven Test Case Design Using Annotated Sequence Diagrams

      • Gencer Erdogan, Atle Refsdal, Ketil Stølen
      Pages 93-108

    4. A Trace Management Platform for Risk-Based Security Testing

      • Jürgen Großmann, Michael Berger, Johannes Viehmann
      Pages 120-135

  5. Back Matter

    Pages 137-137
    PDF
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Other Volumes

  1. Risk Assessment and Risk-Driven Testing

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About this book

This book constitutes the thoroughly refereed conference proceedings of the First International Workshop on Risk Assessment and Risk-driven Testing, RISK 2013, held in conjunction with 25th IFIP International Conference on Testing Software and Systems, ICTSS 2013, in Istanbul, Turkey, in November 2013. The revised full papers were carefully reviewed and selected from 13 submissions. The papers are organized in topical sections on risk analysis, risk modeling and risk-based testing.
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Keywords

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Editors and Affiliations

  • Fraunhofer IESE, Kaiserslautern, Germany

    Thomas Bauer

  • Fraunhofer Institut FOKUS, Berlin, Germany

    Jürgen Großmann, Marc-Florian Wendland

  • SINTEF ICT, Oslo, Norway

    Fredrik Seehusen, Ketil Stølen

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Bibliographic Information

  • Book Title: Risk Assessment and Risk-Driven Testing

  • Book Subtitle: First International Workshop, RISK 2013, Held in Conjunction with ICTSS 2013, Istanbul, Turkey, November 12, 2013. Revised Selected Papers

  • Editors: Thomas Bauer, Jürgen Großmann, Fredrik Seehusen, Ketil Stølen, Marc-Florian Wendland

  • Series Title: Lecture Notes in Computer Science

  • DOI: https://doi.org/10.1007/978-3-319-07076-6

  • Publisher: Springer Cham

  • eBook Packages: Computer Science, Computer Science (R0)

  • Copyright Information: Springer International Publishing Switzerland 2014

  • Softcover ISBN: 978-3-319-07075-9Published: 25 July 2014

  • eBook ISBN: 978-3-319-07076-6Published: 09 July 2014

  • Series ISSN: 0302-9743

  • Series E-ISSN: 1611-3349

  • Edition Number: 1

  • Number of Pages: IX, 137

  • Number of Illustrations: 35 b/w illustrations

  • Topics: Software Engineering, Management of Computing and Information Systems, Systems and Data Security

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Access via your institution

Buy it now

eBook USD 34.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 44.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

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