Springer Theses

Critical Phenomena in Loop Models

Authors: Nahum, Adam

  • Nominated as an outstanding Ph.D. thesis by the University of Oxford, UK
  • Offers a broad perspective on the application of loop models to critical phenomena
  • Relevant to quantum magnetism, disordered systems and polymer physics
  • Introduces new types of geometrical phase transition
  • Advances our understanding of the relation between field theory and random geometry
see more benefits

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-319-06407-9
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-319-06406-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • Customers within the U.S. and Canada please contact Customer Service at 1-800-777-4643, Latin America please contact us at +1-212-460-1500 (Weekdays 8:30am – 5:30pm ET) to place your order.
  • Due: August 30, 2016
  • ISBN 978-3-319-36063-8
  • Free shipping for individuals worldwide
About this book

When close to a continuous phase transition, many physical systems can usefully be mapped to ensembles of fluctuating loops, which might represent for example polymer rings, or line defects in a lattice magnet, or worldlines of quantum particles.
'Loop models' provide a unifying geometric language for problems of this kind.
This thesis aims to extend this language in two directions. The first part of the thesis tackles ensembles of loops in three dimensions, and relates them to the statistical properties of line defects in disordered media and to critical phenomena in two-dimensional quantum magnets. The second part concerns two-dimensional loop models that lie outside the standard paradigms: new types of critical point are found, and new results given for the universal properties of polymer collapse transitions in two dimensions.
All of these problems are shown to be related to sigma models on complex or real projective space, CP^{n−1} or RP^{n−1} -- in some cases in a 'replica' limit -- and this thesis is also an in-depth investigation of critical behaviour in these field theories.

Table of contents (7 chapters)

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-3-319-06407-9
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-3-319-06406-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • Customers within the U.S. and Canada please contact Customer Service at 1-800-777-4643, Latin America please contact us at +1-212-460-1500 (Weekdays 8:30am – 5:30pm ET) to place your order.
  • Due: August 30, 2016
  • ISBN 978-3-319-36063-8
  • Free shipping for individuals worldwide
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Critical Phenomena in Loop Models
Authors
Series Title
Springer Theses
Copyright
2015
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing Switzerland
eBook ISBN
978-3-319-06407-9
DOI
10.1007/978-3-319-06407-9
Hardcover ISBN
978-3-319-06406-2
Softcover ISBN
978-3-319-36063-8
Series ISSN
2190-5053
Edition Number
1
Number of Pages
XVII, 141
Number of Illustrations and Tables
2 b/w illustrations, 36 illustrations in colour
Topics