Environmental Engineering

Physics of Semiconductor Devices

17th International Workshop on the Physics of Semiconductor Devices 2013

Editors: Jain, Vinod Kumar, Verma, Abhishek (Eds.)

  • Physics of Semiconductor Devices
  • Nanotechnology and Emerging Areas
  • Photovoltaics, MEMS & Sensors
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Buy this book

eBook $229.00
price for USA (gross)
  • ISBN 978-3-319-03002-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $299.00
price for USA
  • ISBN 978-3-319-03001-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

The purpose of this workshop is to spread the vast amount of information available on semiconductor physics to every possible field throughout the scientific community. As a result, the latest findings, research and discoveries can be quickly disseminated. This workshop provides all participating research groups with an excellent platform for interaction and collaboration with other members of their respective scientific community.

This workshop’s technical sessions include various current and significant topics for applications and scientific developments, including 

•  Optoelectronics

•  VLSI & ULSI Technology

•  Photovoltaics

•  MEMS & Sensors

•  Device Modeling and Simulation

•  High Frequency/ Power Devices

•  Nanotechnology and Emerging Areas

•  Organic Electronics

•  Displays and Lighting

Many eminent scientists from various national and international organizations are actively participating with their latest research works and also equally supporting this mega event by joining the various organizing committees.

Table of contents (241 chapters)

  • Co-existence of Multiferroic Memories in CoFe2O4/Bi3.4Sm0.6Ti3O12 Composite Structures

    Charris-Hernandez, A. (et al.)

    Pages 3-4

  • Impact of Fin Sidewall Taper Angle on Sub-14 nm FinFET Device Performance

    Dixit, Abhisek (et al.)

    Pages 5-8

  • Capacitance-Voltage Measurement of SiO2/GeOxNy Gate Stack on Surface Passivated Germanium

    Khairnar, Anil G. (et al.)

    Pages 9-11

  • Effect of Supercritical Drying on Sol-Gel Deposited Silica Aerogel Thin Films at Different Temperatures

    Gaikwad, Anil (et al.)

    Pages 13-16

  • Stress-induced Degradation and Defect Studies in Strained-Si/SiGe MOSFETs

    Mukherjee, Chhandak (et al.)

    Pages 17-20

Buy this book

eBook $229.00
price for USA (gross)
  • ISBN 978-3-319-03002-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $299.00
price for USA
  • ISBN 978-3-319-03001-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Physics of Semiconductor Devices
Book Subtitle
17th International Workshop on the Physics of Semiconductor Devices 2013
Editors
  • Vinod Kumar Jain
  • Abhishek Verma
Series Title
Environmental Engineering
Copyright
2014
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing Switzerland
eBook ISBN
978-3-319-03002-9
DOI
10.1007/978-3-319-03002-9
Hardcover ISBN
978-3-319-03001-2
Series ISSN
1431-2492
Edition Number
1
Number of Pages
XXVI, 932
Number of Illustrations and Tables
618 b/w illustrations, 620 illustrations in colour
Topics