Lecture Notes in Nanoscale Science and Technology

FIB Nanostructures

Editors: Wang, Zhiming M. (Ed.)

  • Offers comprehensive coverage of novel nanostructures fabricated by focused ion beam
  • Provides the keys to understanding the emerging area of FIB nanostructures
  • Written by leading experts in each research area
  • Describes a key enabling technology forming a bridge between materials science research and the development of energy-related and other electronic devices
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eBook $179.00
price for USA (gross)
  • ISBN 978-3-319-02874-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $229.00
price for USA
  • ISBN 978-3-319-02873-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $229.00
price for USA
  • Customers within the U.S. and Canada please contact Customer Service at 1-800-777-4643, Latin America please contact us at +1-212-460-1500 (Weekdays 8:30am – 5:30pm ET) to place your order.
  • Due: October 14, 2016
  • ISBN 978-3-319-37468-0
  • Free shipping for individuals worldwide
About this book

FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electrical engineering, and materials science departments as a reference on materials science and device design.

Table of contents (19 chapters)

  • Focused Ion Beam (FIB) Technology for Micro- and Nanoscale Fabrications

    Kant, Krishna (et al.)

    Pages 1-22

  • Epitaxial Ferroelectric Nanostructures Fabricated by FIB Milling

    Morelli, Alessio (et al.)

    Pages 23-43

  • Low-Current Focused Ion Beam Milling for Freestanding Nanomaterial Characterization

    Li, Wuxia (et al.)

    Pages 45-62

  • Focused Ion Beam Milling of Carbon Nanotube Yarns and Bucky-Papers: Correlating Their Internal Structure with Their Macro-Properties

    Sears, Kallista (et al.)

    Pages 63-93

  • Nanoscale Electrical Contacts Grown by Focused Ion Beam (FIB)-Induced Deposition

    Teresa, J. M. (et al.)

    Pages 95-122

Buy this book

eBook $179.00
price for USA (gross)
  • ISBN 978-3-319-02874-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $229.00
price for USA
  • ISBN 978-3-319-02873-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $229.00
price for USA
  • Customers within the U.S. and Canada please contact Customer Service at 1-800-777-4643, Latin America please contact us at +1-212-460-1500 (Weekdays 8:30am – 5:30pm ET) to place your order.
  • Due: October 14, 2016
  • ISBN 978-3-319-37468-0
  • Free shipping for individuals worldwide
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Bibliographic Information

Bibliographic Information
Book Title
FIB Nanostructures
Editors
  • Zhiming M. Wang
Series Title
Lecture Notes in Nanoscale Science and Technology
Series Volume
20
Copyright
2013
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing Switzerland
eBook ISBN
978-3-319-02874-3
DOI
10.1007/978-3-319-02874-3
Hardcover ISBN
978-3-319-02873-6
Softcover ISBN
978-3-319-37468-0
Series ISSN
2195-2159
Edition Number
1
Number of Pages
XIII, 530
Number of Illustrations and Tables
175 b/w illustrations, 200 illustrations in colour
Topics