Authors:
- Provides a comprehensive summary of state-of-the-art on post-silicon validation
- Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer
- Illustrate key concepts and algorithms with real examples
- Includes supplementary material: sn.pub/extras
Part of the book series: Lecture Notes in Electrical Engineering (LNEE, volume 252)
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Table of contents (9 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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University of California, Berkeley, Stanford, USA
Xiao Liu
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The Chinese University of Hong Kong, Shatin, N.T., Hong Kong SAR
Qiang Xu
Bibliographic Information
Book Title: Trace-Based Post-Silicon Validation for VLSI Circuits
Authors: Xiao Liu, Qiang Xu
Series Title: Lecture Notes in Electrical Engineering
DOI: https://doi.org/10.1007/978-3-319-00533-1
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer International Publishing Switzerland 2014
Hardcover ISBN: 978-3-319-00532-4Published: 27 June 2013
Softcover ISBN: 978-3-319-37594-6Published: 23 August 2016
eBook ISBN: 978-3-319-00533-1Published: 12 June 2013
Series ISSN: 1876-1100
Series E-ISSN: 1876-1119
Edition Number: 1
Number of Pages: XV, 108
Number of Illustrations: 21 b/w illustrations, 38 illustrations in colour
Topics: Circuits and Systems, Processor Architectures, Semiconductors