Lecture Notes in Electrical Engineering

Trace-Based Post-Silicon Validation for VLSI Circuits

Authors: Liu, Xiao, Xu, Qiang

  • Provides a comprehensive summary of state-of-the-art on post-silicon validation
  • Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer
  • Illustrate key concepts and algorithms with real examples
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  • ISBN 978-3-319-00533-1
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  • ISBN 978-3-319-00532-4
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  • ISBN 978-3-319-37594-6
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About this book

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

Table of contents (9 chapters)

  • Introduction

    Liu, Xiao (et al.)

    Pages 1-4

  • State of the Art on Post-Silicon Validation

    Liu, Xiao (et al.)

    Pages 5-10

  • Signal Selection for Visibility Enhancement

    Liu, Xiao (et al.)

    Pages 11-30

  • Multiplexed Tracing for Design Error

    Liu, Xiao (et al.)

    Pages 31-46

  • Tracing for Electrical Error

    Liu, Xiao (et al.)

    Pages 47-60

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-3-319-00533-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-3-319-00532-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-3-319-37594-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Trace-Based Post-Silicon Validation for VLSI Circuits
Authors
Series Title
Lecture Notes in Electrical Engineering
Series Volume
252
Copyright
2014
Publisher
Springer International Publishing
Copyright Holder
Springer International Publishing Switzerland
eBook ISBN
978-3-319-00533-1
DOI
10.1007/978-3-319-00533-1
Hardcover ISBN
978-3-319-00532-4
Softcover ISBN
978-3-319-37594-6
Series ISSN
1876-1100
Edition Number
1
Number of Pages
XV, 108
Number of Illustrations and Tables
21 b/w illustrations, 38 illustrations in colour
Topics