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Advanced Transmission Electron Microscopy

Imaging and Diffraction in Nanoscience

Authors: Zuo, Jian Min, Spence, John C.H.

  • Serves as an expanded and thoroughly updated successor to the authors’ 1992 “Electron Microdiffraction,” the leading text in the field
  • Improves on previous coverage of electron wave properties and electron diffraction theory in addition to many new chapters in such areas as strain-field analysis and electron detectors
  • Offers comprehensive, quantitative treatments of crystal symmetry, crystal structure and bonding, diffuse scattering, strain measurements, defects and nanostructure characterization
  • Provides new coverage of electron optics, principles of aberration correction and energy filters, electron nanodiffraction techniques, and TEM and STEM imaging theory
  • Presents the latest information on nanostructure analysis, emphasizing quantitative analysis of images and diffraction patterns
  • Includes numerous tables and figures for electron crystallography, and source listings of simulation and modeling computer programs
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eBook $109.00
price for USA (gross)
  • ISBN 978-1-4939-6607-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $139.00
price for USA
  • ISBN 978-1-4939-6605-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this Textbook

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

About the authors

Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society.
John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).

Table of contents (17 chapters)

  • Introduction and Historical Background

    Zuo, Jian Min (et al.)

    Pages 1-18

  • Electron Waves and Wave Propagation

    Zuo, Jian Min (et al.)

    Pages 19-47

  • The Geometry of Electron Diffraction Patterns

    Zuo, Jian Min (et al.)

    Pages 49-75

  • Kinematical Theory of Electron Diffraction

    Zuo, Jian Min (et al.)

    Pages 77-100

  • Dynamical Theory of Electron Diffraction for Perfect Crystals

    Zuo, Jian Min (et al.)

    Pages 101-141

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-1-4939-6607-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $139.00
price for USA
  • ISBN 978-1-4939-6605-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Advanced Transmission Electron Microscopy
Book Subtitle
Imaging and Diffraction in Nanoscience
Authors
Copyright
2017
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4939-6607-3
DOI
10.1007/978-1-4939-6607-3
Hardcover ISBN
978-1-4939-6605-9
Edition Number
1
Number of Pages
XXVI, 729
Number of Illustrations and Tables
92 b/w illustrations, 218 illustrations in colour
Topics