Overview
- Includes supplementary material: sn.pub/extras
Part of the book series: Advanced Texts in Physics (ADTP)
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Table of contents (14 chapters)
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Experimental Realization
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Basic Principles
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X-Ray Scattering by Laterally Structured Semiconductor Nano-Structures
Keywords
About this book
Authors and Affiliations
Bibliographic Information
Book Title: High-Resolution X-Ray Scattering
Book Subtitle: From Thin Films to Lateral Nanostructures
Authors: Ullrich Pietsch, Václav Holý, Tilo Baumbach
Series Title: Advanced Texts in Physics
DOI: https://doi.org/10.1007/978-1-4757-4050-9
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2004
Hardcover ISBN: 978-0-387-40092-1Published: 27 August 2004
Softcover ISBN: 978-1-4419-2307-3Published: 12 December 2011
eBook ISBN: 978-1-4757-4050-9Published: 09 March 2013
Series ISSN: 1439-2674
Edition Number: 2
Number of Pages: XVI, 408
Number of Illustrations: 389 b/w illustrations
Additional Information: Originally published as Volume 149 in the series: Springer Tracts in Modern Physics
Topics: Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Nanotechnology, Optics, Lasers, Photonics, Optical Devices