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Bias Temperature Instability for Devices and Circuits

Editors: Grasser, Tibor (Ed.)

  • Enables readers to understand and model negative bias temperature instability, with an emphasis on dynamics
  • Includes coverage of DC vs. AC stress, duty factor dependence and bias dependence
  • Explains time dependent defect spectroscopy, as a measurement method that operates on nanoscale MOSFETs
  • Introduces new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior
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eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-7909-3
  • Digitally watermarked, DRM-free
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  • Immediate eBook download after purchase
Hardcover $139.00
price for USA
  • ISBN 978-1-4614-7908-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $139.00
price for USA
  • ISBN 978-1-4939-5529-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
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About this book

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Table of contents (30 chapters)

  • Bias Temperature Instability Characterization Methods

    Kerber, Andreas (et al.)

    Pages 3-31

  • Application of On-Chip Device Heating for BTI Investigations

    Aichinger, Thomas (et al.)

    Pages 33-51

  • Statistical Characterization of BTI-Induced High-k Dielectric Traps in Nanoscale Transistors

    Wang, Tahui (et al.)

    Pages 53-74

  • The Time-Dependent Defect Spectroscopy

    Reisinger, Hans

    Pages 75-109

  • Analysis of Oxide Traps in Nanoscale MOSFETs using Random Telegraph Noise

    Frank, David J. (et al.)

    Pages 111-134

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-7909-3
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $139.00
price for USA
  • ISBN 978-1-4614-7908-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $139.00
price for USA
  • ISBN 978-1-4939-5529-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Bias Temperature Instability for Devices and Circuits
Editors
  • Tibor Grasser
Copyright
2014
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4614-7909-3
DOI
10.1007/978-1-4614-7909-3
Hardcover ISBN
978-1-4614-7908-6
Softcover ISBN
978-1-4939-5529-9
Edition Number
1
Number of Pages
XI, 810
Number of Illustrations and Tables
283 b/w illustrations, 318 illustrations in colour
Topics