Analog Circuits and Signal Processing

Analog IC Reliability in Nanometer CMOS

Authors: Maricau, Elie, Gielen, Georges

  • Enables readers to understand long-term reliability of an integrated circuit
  • Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes
  • Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology
  • Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit
see more benefits

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-6163-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-1-4614-6162-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4899-8630-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
About this book

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

Table of contents (7 chapters)

  • Introduction

    Maricau, Elie (et al.)

    Pages 1-14

  • CMOS Reliability Overview

    Maricau, Elie (et al.)

    Pages 15-35

  • Transistor Aging Compact Modeling

    Maricau, Elie (et al.)

    Pages 37-77

  • Background on IC Reliability Simulation

    Maricau, Elie (et al.)

    Pages 79-91

  • Analog IC Reliability Simulation

    Maricau, Elie (et al.)

    Pages 93-149

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-6163-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-1-4614-6162-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4899-8630-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Analog IC Reliability in Nanometer CMOS
Authors
Series Title
Analog Circuits and Signal Processing
Copyright
2013
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4614-6163-0
DOI
10.1007/978-1-4614-6163-0
Hardcover ISBN
978-1-4614-6162-3
Softcover ISBN
978-1-4899-8630-6
Series ISSN
1872-082X
Edition Number
1
Number of Pages
XVI, 198
Topics